Dimensional Metrology

Dimensional metrology holds the principles of measurement to obtain the physical size or the distance from an object to great accuracy through the correct calibration of the associated tools. The metrology service at CERN combines a broad testing capability with highly specialized team. The techniques and equipment available go from conventional tools and methods to state-of-the-art technologies that sometimes can be used in-situ thanks to portative devices.

Metrology expert using portative laser scanner Metrascan

Techniques and equipment:

  • Coordinate Measuring Machines (CMMs)
  • Manual devices
  • Surface roughness
  • 3D laser scanners
  • Computed Tomography (CT)
  • Portable techniques and devices
ATLAS chip

ATLAS chip tomography

Shape accuracy control of CLIC Cu-OFE disc after ultra-high precission machining

CLIC disc during quality control