The microscopy team is devoted to providing material characterisation including topographical imaging, morphology, phase identification and chemical analysis through the utilisation of Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB)-SEM and X-ray Diffraction (XRD). These are applied in conjunction with associated techniques including, for example Energy Dispersive X-ray Spectroscopy (EDX), Electron Backscatter Diffraction (EBSD), FIB tomography and Scanning Transmission Electron Microscopy (STEM).

Material characterisation is carried out on a wide range of materials with emphasis on metals and alloys, which display great compatibility with electron microscopy apparatus, along with ceramics, composites and thin film specimens. Materials experts will apply these techniques appropriately to extract the maximum amount of information from your sample to help you during your research, development or  failure analysis.

Equipment

• ΣIGMA Field Emission Gun-Scanning Electron Microscope (FEG-SEM) from Carl Zeiss
• ΣIGMA 500 Field Emission Gun-Scanning Electron Microscope (FEG-SEM) from Carl Zeiss
• Cross Beam 540 Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) from Carl Zeiss
• D8 Discover X-ray Diffractometer (XRD) from Bruker

Advanced Techniques

• Energy Dispersive X-ray Spectroscopy (EDX)
• Electron Backscattered Diffraction (EBSD)
• Focused Ion Beam (FIB) tomography
• Lamella preparation and Scanning Transmission Electron Microscopy (STEM)