Correlative microscopy is a discipline that combines imaging and analytical methods of light and electron microscopy. Normally, starting with a light microscope defining a region of interest and completing the observation with more detailed analysis using electron microscopy techniques into a Scanning Electron Microscope (SEM) or Focused Ion Beam (FIB)-SEM. 

Move seamlessly from the micro to nano scale is possible thanks to a special module of the light microscope and SEMs available in the MM section and special stage with references that allow a precise triangulation when the sample is inspected by the different systems